Used KLA / TENCOR P2 #9217450 for sale

KLA / TENCOR P2 is a wafer testing and metrology equipment designed for advanced semiconductor wafer inspection and analysis. It provides reliable, world-class process control and defect detection capabilities. KLA P-2 enables customers to achieve the highest possible process yields, yield stability and process cycle time optimization. The system's modular platform enables customers to customize to their specific requirements and the product is designed for maximum flexibility and scalability, making it ideal for any size wafer fab. TENCOR P 2 has a high-resolution FPD (Flat Panel Display) display for excellent image quality and a reliable, easy-to-use touchscreen interface. The unit is composed of several components, including a Beam Deflection Machine (BDS), a High Voltage Supply and Electronics (HVSE) unit, a large-format White Light Camera (WLC) and a Real-Time Image Processor (RTIP). The BDS unit is responsible for deflecting the light beam generated by the HVSE unit off the surface of the wafer, allowing the WLC to capture images of the wafer's surface. The RTIP is responsible for processing the images captured by the WLC and communicating with the other components of the tool. The WLC captures high-precision images of the wafer's surface and provides real-time defect detection capabilities. The asset can be used to identify a range of defects on the wafer, including: surface defects, surface irregularities, flatness problems, particle contamination, strain layers, and more. KLA / TENCOR P-2 supports a range of metrology options such as optical and electrical measurements for a complete understanding of the wafer's surface. TENCOR P-2 is available with a variety of options, including a wide range of inspection modes, target synchronization technology, on-site data storage, and advanced data processing capabilities. The model can also be integrated with third-party systems, enabling customers to leverage its functionalities. In summary, P2 is a powerful and reliable wafer testing and metrology equipment. It offers an ideal platform for advanced defect detection and increased process yields. The system is highly customizable, enabling customers to configure it to meet their specific requirements. TENCOR P2 enables customers to achieve accurate and reliable wafer testing and metrology results, and is the ideal solution for semiconductor wafer fabrication.