Used KLA / TENCOR P2 #9226183 for sale

KLA / TENCOR P2 Wafer Testing and Metrology Equipment is a state-of-the art system that enables accurate and consistent measurements and metrology of semiconductor wafers. It includes a vision unit, integrated metrology and analysis software, automated contact measurement, and integrated batch cycle support. The machine is ideal for process and quality control, wafer mapping, and RMA (Return Merchandise Authorization) operations. The vision tool in KLA P-2 utilizes powerful cameras configured to capture high-resolution images across the entire wafer. The asset's measurements are precise and repeatable, with minimal image alignment required. It can capture up to 16 wafers per minute for maximum throughput and can identify the start of each wafer or measure full rings in one step. The integrated metrology and analysis software of the model is efficient and user-friendly. It collects, stores and transmits data across the entire process. The software has powerful data analysis algorithms to optimize production processes and improve yield. Additionally, it can find and diagnose material defects, predict performance, and display batch-level metrics. The automated contact measurement on TENCOR P 2 is another key feature. Its high-speed contactless scanning can make simultaneous measurements on multiple wafers with one scan. It is also capable of measuring precise non-planar surfaces, bridge measurement on small features, and oblique measurements in both horizontal and vertical directions. Finally, KLA P2 Wafer Testing and Metrology Equipment includes integrated batch cycle support to streamline production and minimize waste. This makes it easier to automate processes across multiple machines, control the repeatability, manage a batch of wafers, and track parts going through each wafer. Overall, P2 Wafer Testing and Metrology System is a comprehensive and reliable solution for semiconductor wafer testing and metrology. It is equipped with sophisticated vision unit, integrated metrology and analysis software, automated contact measurement, and integrated batch cycle support that will help organizations meet their wafer testing and metrology requirements.