Used KLA / TENCOR P2 #9281925 for sale

KLA / TENCOR P2 Wafer Testing and Metrology Equipment is an automated scanning electron microscope (SEM) specifically designed for IC fabrication and testing. The system is capable of imaging nanoscale features on substrate wafers and die in regards to quality, uniformity, and consistency. KLA P-2 is engineered specifically for tight-tolerance process control and systematic defect analysis, and features the most robust, reliable, and reproducible performance. TENCOR P 2 features the optics and electronics components needed to quickly and accurately analyze large numbers of devices in both industrial wafer and die applications. P-2 can acquire in-context and die-level images, measurements, and counts with high precision and repeatability. The WaferSense® electronics are integrated into the internal mechanisms of TENCOR P2, and automatically set up and calibrate test conditions prior to imaging. This helps to eliminate human error and significantly improve test resolution and accuracy. It also increases the speed at which wafers and die can be tested, as the tests can be completed in just minutes. KLA / TENCOR P-2 is also equipped with an innovative imaging detector that delivers superior image clarity and signal-to-noise ratio. This state-of-the-art CCD detector automatically adjusts image parameters, allowing for improved resolution and greater contrast between different device features. The unit is also capable of building semi-automated and automatic recipes for inspection and measurement tasks. This helps to eliminate manual programming and eliminate human errors associated with manually coding recipes. KLA P2 also stores all acquired data, which can be easily retrieved and analyzed for comparison. In short, KLA P 2 machine is a powerful, reliable, and accurate automated scanning electron microscope tool. It is designed for tight tolerance process control and systematic defect analysis in a wide range of IC fabrication and testing applications, and features the most up-to-date imaging and measurement capabilities. Its WaferSense electronics and advanced illumination capabilities ensure unbeatable resolution and accuracy, while the automated recipe feature silently takes complete control of the asset. P 2 is thus an ideal tool for optimizing device yield and quality assurance in the semiconductor industry.