Used KLA / TENCOR P2 #9284967 for sale

KLA / TENCOR P2 Wafer Testing and Metrology equipment is a versatile and comprehensive metrologic solution for automated relative placement, die-to-database alignment, image inspection, precision metrology, and feature, size, shape and orientation analysis. This system is designed for use in production and research environments in the semiconductor, flat panel display, and micro-electro-mechanical systems (MEMS) industries. KLA P-2 is composed of a number of components that work together to enable reliable and accurate testing and metrology. It features an area-array camera and a multi-axis motion controller, both of which perform high-precision alignment and feature recognition operations. The camera actively captures the entire surface of the wafer and converts the images to digital information. This data is then transferred to the motion controller, which allows for automated relative placement of the wafer to the layout pattern. The motion controller also aligns the wafer layout to a stored database and is used to detect defects, such as scratched surfaces and mismatched features. In addition, TENCOR P 2 is integrated with an optical metrology unit, which is used to measure the size, shape, and orientation of wafer features. This machine uses an array of lasers to provide precise measurements of various materials, including films, resistors, transistors, and physical structures. The tool is configurable and can be customized for measuring different types of shapes, such as round posts or tapered surfaces. Additionally, it can be used to measure different thicknesses, such as substrate or refractive index, and can even measure across foreign objects that might be on the wafer. KLA / TENCOR P-2 asset also features a die-to-database alignment model, which is used for analyzing and detecting defects on the wafer during production. The equipment supports both front-side and back-side inspection of the wafer and allows for automated, full-wafer die placement. TENCOR P2 also offers advanced image processing capabilities, such as defect detection, noise reduction, and color correction. KLA / TENCOR P 2 is a comprehensive wafer testing and metrology solution that enables precise, accurate, and automated testing and measurement of wafer features. It is specifically designed to increase production efficiency and accuracy and is suitable for a wide range of industries, including semiconductors, flat panel displays, and MEMS.