Used KLA / TENCOR P2 #9291906 for sale

KLA / TENCOR P2 is an advanced wafer testing and metrology equipment designed for both wafer edge and center measurements. Itprovides users with an automated solution for metrology information processing, such as wafer surface inspection, wafer defect analysis, wafer shape measurements, and wafer material verification. The system employs an advanced laser based wafer edge detection unit, the advanced wafer metrology (AWM) technology, to accurately monitor the wafer edge position, detect deviations in the shape or geometry, and quantify changes in the wafer's edge characteristics. It also integrates advanced light-source metrology technology to inspect and measure the surface topography of the wafer. As part of the machine, an infrared laser and an imaging camera are used to identify variations in surface material composition and detect defects such as scratches and surface defects. Additional metrology information derived from the tool includes metal line and 3D profile process control data, information on wafer cleanliness, measurements of wafer flatness, mapping of surface characteristics, and inspection of the surface roughness. This enables users to obtain a comprehensive data set of the wafer manufacturing process, including its yield performance. In addition to the detection of surface defects, the asset also integrates a range of other algorithms to measure wafer shape in three dimensions. This allows users to accurately quantify differences in wafer shape and dimensions, and generate metric data from the measured wafers, such as flatness, deformation of wafer edges, as well as cross-sectional area. The model further benefits from an integrated graphical user interface for visualizing real time measurements. This enables users to quickly view current test data as well as review past data and gain full insight into the equipment performance. The system is also compatible with various data output formats, allowing for easy data sharing and collaboration between different machines. In conclusion, KLA P-2 is an advanced wafer testing and metrology unit, offering users a user friendly, automated solution for accurately monitoring wafer surface and shape as well as deriving process control data. It provides an invaluable view into the current status of wafer manufacturing processes, helping users to reduce defects and ensure quality control.