Used KLA / TENCOR P2 #9383469 for sale

KLA / TENCOR P2 wafer testing and metrology equipment is an automated, non-contact optical platform capable of measuring high-precision surface features across all 150mm and 200mm wafer sizes. KLA P-2 system features a dedicated, high-resolution microscope for capturing clear and accurate images of wafers before and after processing. The microscope is equipped with a large field of view, enhanced spatial resolution, and optional UV illumination to ensure accurate wafer images are taken. The unit is designed for image capture in a variety of formats, including non-contact imaging, magnified spot mode design, and advanced KLA proprietary imaging technologies. The optical imaging of TENCOR P 2 machine can detect defects, such as particles, pits, scratches, and patterned defects, that can be used to ensure product high-yield and quality. The tool also runs advanced algorithms for defect characterization, allowing users to accurately identify and flag defects and isolate trouble areas in fabrication process. Additionally, the asset has powerful analytics for deeper understanding of product and process data. P-2 model also features a robust automatic handling equipment that is suitable for processing wafers from 8-inch to 12-inch sizes. It has a thermal chuck that can ensure wafers remain at a consistent temperature during measurements, enabling accurate measurements and repeatable results. The system features advanced robotics for automated wafer handling and placement, eliminating manual handling of wafers throughout the inspection process. P2 unit delivers repeatable measurements and with a proven track record for high performance and reliability. It has a modular design for easy scalability as necessary, and integrates with other TENCOR systems, such as advanced pattern recognition and process control systems. This enables users to easily expand their inspection capabilities to cover a wide range of product specifications and industries. TENCOR P-2 wafer testing and metrology machine is state-of-the-art platform designed to provide accurate and reliable wafer measurements for improved product quality and yields. With its superior imaging optics, automated wafer handling, and integrated process control solutions, KLA P2 tool is a powerful inspection solution for industries such as semiconductor, LED, and MEMS.