Used KLA / TENCOR P2 #9402153 for sale

KLA / TENCOR P2 is an automated wafer testing and metrology equipment that is used for inspecting semiconductor devices and circuits. It offers a range of integrated functions for in-line sample monitoring, classification, failure analysis, and defect isolation. The system utilizes various optical, electrical, and optothermal techniques to inspect and characterize wafers. It consists of two main components: the Wafer Analyzer and the Wafer Level Metrology (WLM) subsystem. The Wafer Analyzer scans each area sequentially and collects electrical data that's used to identify defects, while the WLM subsystem integrates both optical and electrical information that's used to characterize, measure and verify the structural properties and electrical performance of each device. For electrical testing and characterization, the unit uses a spectral imaging technique that measures the resistance, capacitance, and other device parameters with high accuracy and resolution. The electrical characterization capabilities provide powerful fault isolation and failure analysis capabilities for devices. The WLM subsystem integrates the optical and electrical test information together in a single platform. This enables the machine to measure multiple aspects of the wafer in a single scan and enhance the accuracy of device characterizations. For failure analysis and defect isolation, the tool utilizes several imaging techniques including bright field, dark field, and spectral imaging. The asset is also equipped with stress testing capabilities to simulate real-world conditions and accurately identify failed devices under varying conditions. KLA P-2 is designed to rapidly and accurately monitor and characterize wafers in semiconductor production environment. It provides a high quality and cost-effective solution for manufacturers who require high-fidelity device characterization, fault isolation and failure analysis. It enables faster turnaround time in the production process and improved production yields.