Used KLA / TENCOR P20 #293628464 for sale

KLA / TENCOR P20 is a wafer testing and metrology equipment that uses a CCD imaging device coupled with an advanced laser measurement system to detect defects in semiconductor materials. It is a powerful tool for process control, failure analysis, and production monitoring of wafer-based devices. KLA P-20 has variable sensitivity settings that allow it to detect submicron-sized defects. The CCD imaging device is used to scan the wafer surface. As the device moves over the wafer surface, the laser beam measures the reflected light reflected off the wafer surface. This recorded data is used to identify surface defects and other problems in the wafer. The CCD imaging unit is equipped with a high resolution, high speed scan engine that enables fast and accurate measurements. The scan speed is adjustable and the maximum scan time is 1 second. The machine also features a measurement database that stores all data from inspections. The tool is highly reliable and has built-in features including an integrated asset controller, real-time process monitoring, programmable failure alarms, and automatic test stand mode. It is also integrated with a software which provides an easy-to-use interface for data analysis and report generation. TENCOR P 20 model is designed for long-term operation and can be used in the production environment. Its large capacity and reliable operation make it suitable for the process control, failure analysis, and production monitoring of advanced devices. Its advanced diagnostics and defect reporting equipment make it ideal for production monitoring and defect detection. In conclusion, KLA / TENCOR P 20 is a high performance wafer testing and metrology system that includes an advanced laser measurement unit and a high resolution, high speed scan engine. It is a useful tool for process control, failure analysis and production monitoring of wafer-based devices.