Used KLA / TENCOR P20 #9399018 for sale

KLA / TENCOR P20 is a revolutionary wafer testing and metrology equipment developed by KLA. It boasts several advances in highly automated sensing, imaging, and control technologies for high throughput in advanced semiconductor manufacturing. KLA P-20 is designed for both front-end and back-end wafer tests in existing production lines. It accurately measures device performance parameters, featuring a large dynamic range, high speed, and superior accuracy. For Each Wafer Frontend test the system performs sub-wavelength multipoint measurements and imaging while characterizing defects. This is done with a combination of high speed beam steering, optical interferometry, and beam energy control. The unit uses the latest in machine learning and artificial intelligence algorithms to analyze and classify data to create accurate defect classification maps as well as yield trending and throughput optimization models. It delivers reliable, repeatable results even in difficult process windows and yields consistent top-notch results. In addition to offering superior accuracy, TENCOR P 20 also offers a very fast measurement speed with a 10 to 1000 GHz gigahertz rotation speed that can accurately measure up to fifty wafers in only minutes. The machine also features a low noise floor and high dynamic range for superior accuracy and repeatability. Its cost effectiveness and highly automated operation make it ideal for both high-volume and small-scale applications in a wide range of production line models. Overall, KLA P 20 is an ideal tool for testing and metrology for advanced semiconductor manufacturing in existing production lines. Its wide range of features and technologies make it a highly efficient and precise machine that can handle even the most difficult tasks with superior accuracy and repeatability.