Used KLA / TENCOR P20H #293753931 for sale

ID: 293753931
Wafer Size: 8"
Vintage: 1996
High resolution profiler, 8" Cassette port Wafer shape: SNNF (Semi notch no flat) Wafer cassette: 8" PP (Miraial: KM-803P-K) Includes: Computer unit Sensor (Micro head 1 LF) Open wafer handler, 8" Star JR-100 graphic printer Option: SECS/GEM No SMIF 1996 vintage.
KLA / TENCOR / PROMETRIX P-20H is a high-precision wafer testing and metrology equipment used for semiconductor device fabrication. It is an automated multi-sensor system used to analyze and characterise the electrical, optical, and physical properties of a single semiconductor wafer. KLA P-20H unit can measure the electrical characteristics of a device with the help of the in-situ probing head and its capacitance-to-voltage converter. In addition, an optical machine is used to characterise a device's geometry, including line width and depth, with great precision. Further analysis of micron geometry and surface features is performed using an adjustable focus stylus. The metrology tool uses KLA proprietary non-contact metrology technology which provides high accuracy and repeatability. It is capable of measuring nanometre-scale features with unprecedented accuracy and repeatability. The asset is capable of running high speed production jobs, measuring up to 250 wafers per hour while maintaining high levels of accuracy. TENCOR P20H is also designed to be highly reliable and low maintenance. It has a solid state design with minimal moving parts, which reduces the potential of environmental damage and wear. It also has an easy user interface and control model, with dynamic navigation and navigation links, which makes it easy to use and understand. In addition, P20H is equipped with TENCOR unique metrology software package. It includes tools for automated alignment and probe calibration, defect detection and wafer analysis, and statistical process control. This ensures that the data obtained from the equipment is reliable and accurate. Overall, KLA / TENCOR / PROMETRIX P20H is a powerful and reliable metrology system for semiconductor device fabrication. It provides unbeatable accuracy, repeatability and speed, making it suitable for a variety of production environments. It has been designed to be highly reliable and low maintenance, making it ideal for high-performance production.
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