Used KLA / TENCOR P22H #9411708 for sale

KLA / TENCOR P22H is a wafer testing and metrology equipment designed for the inspection and process control of semiconductor devices. It combines sophisticated algorithms with highly advanced automated inspection technology for fast and accurate wafer production. KLA P22 H system provides the capability to scan and detect process defects on both patterned and unpatterned substrates with its high-resolution imaging spectrometer and microscope. Multiple light sources of different wavelengths enable the unit to apply various optical inspection techniques for enhanced detection of contaminants on the wafers. Inspected substrates are then evaluated according to predetermined criteria in order to detect any irregularities or defects in the form of lithographic, topographical or etch defects, material masking or poor feature placement. The machine also offer the capability to monitor the cumulative wearing of critical process parameters and thus ensures high-level process and product stability. TENCOR P-22H features a 3D aerospace multi-sensor autofocus to ensure that each inspected wafer surface is optimally focused on the optical imaging tool. By using this autofocus asset, it can ensure that the image quality is of consistent quality which leads to improved accuracy and data accuracy of the inspected material. The model also provides fast and accurate measurements of small features on semiconductors. The high-quality optical imaging equipment allows for fast mapping of patterns on the wafer surface. This system is ideal for high-resolution applications such as depth, area and volume measurements in circuits, contact holes, line narrows and other special test sites. KLA / TENCOR P-22H wafer testing and metrology unit is the ideal solution for improving quality and reducing costs in the semiconductor industry. By combining sophisticated algorithms with advanced automated inspection technology, it offers the best combination of accuracy and speed for ensuring optimal wafer production.