Used KLA / TENCOR P2H #9082646 for sale

KLA / TENCOR P2H is a fully automated wafer testing and metrology equipment designed to support a wide range of processes in the semiconductor industry. The system is equipped with advanced imaging and analysis capabilities for high resolution imaging of wafer surfaces and features. It provides precise measurements, including both shape and size, of wafers, dies, and surfaces. The unit features a servo-driven die measuring module, which uses advanced vision algorithms to detect small-scale features on the wafer surfaces. The machine provides measurements for wafer flatness, surface roughness, and bevel angle. The tool is equipped with multiple optical sensors that provide high accuracy measurements, and it also includes an autofocus function for precision alignment. The asset also utilizes advanced automatic pattern recognition algorithms to detect defects and anomalies on the wafer surfaces. This allows users to identify potential issues quickly and accurately, and can provide valuable insights into the underlying process. The model also features intelligent software for data analysis and reporting. It supports a range of analysis capabilities, including surface texture analysis, particle size measurement, wafer curvature analysis, and statistical process control. The software also includes an advanced reporting functionality that allows users to create customized reports with clear and detailed information. In addition to its optical performance, KLA P-2H is also equipped with advanced sample handling capabilities. The equipment has an integrated sample feeder that can store up to 150 wafers in queue and can interface to additional sample feeders. Furthermore, the system features an integrated substrate robot, which provides precise wafer placement and handling. Overall, TENCOR P 2H is a versatile and powerful wafer testing and metrology unit that is designed to support a wide range of processes in the semiconductor industry. The machine provides advanced measurement capabilities for precise measurements of small-scale features on the wafer surfaces. The tool also provides intelligent software for data analysis and reporting, sample handling capabilities, and automated pattern recognition algorithms. P2H is a powerful and reliable asset that can be used to ensure the highest quality and sustainability of production.