Used KLA / TENCOR PHX DF 5.0 #293660076 for sale

KLA PHX DF 5.0 is a wafer testing and metrology equipment designed to provide high-fidelity results in semiconductor manufacturing. This system is designed to provide some of the highest levels of resolution and accuracy available in the market. TENCOR PHX DF 5.0 utilizes a multi-camera imaging architecture. This composite imaging unit combines high-speed cameras and sensitive CCD chips to allow a complete imaging field of view over the entire wafer. The high-speed cameras enable high frame-rates over the entire wafer for precise and detailed inspection and metrology. Additionally, KLA / TENCOR PHX DF 5.0 has advanced lighting and illumination systems, allowing for sharp and contrast images. This precision is ideal for advanced critical dimension (CD) measurements and defect characterization. The machine also features a state-of-the-art automated tool for efficient operation. This asset includes the latest in sophisticated pattern recognition and image processing algorithms, enabling high-resolution automated wafer inspection. The automated model, in combination with fast imaging, provides superior defect detection capabilities. The equipment can detect extremely small defects that are difficult to be detected using conventional inspection methods. Additionally, the system has integrated process control systems, allowing for process optimization and quick corrective action when needed. KLA PHX DF 5.0 is also equipped with advanced characterization algorithms that allow for accurate and detailed classification of defects. This unit allows for flexible parameter settings, allowing for thorough characterization and analysis of even the most complex wafers. It also features integrated metrology capabilities, allowing for precise 3D topography measurements. Additionally, the machine has an in-situ analysis module, allowing for real-time characterization of wafer defects. Overall, TENCOR PHX DF 5.0 is a powerful and robust wafer testing and metrology tool that provides accurate and high-fidelity results. With its advanced imaging, automation, and metrology capabilities, the asset is capable of rapid, reliable, and high-resolution wafer inspections, enabling maximum process control and optimization.