Used KLA / TENCOR Alpha Step 500 #9215920 for sale

KLA / TENCOR Alpha Step 500 is an advanced wafer testing and metrology equipment designed for rapid, precise and accurate measurement of extremely complex semiconductor device architectures. It utilizes the latest in scanning probe microscope (SPM) technology to quickly and accurately measure the position and orientation of the device components. KLA Alpha Step 500 is especially useful for measuring nano-scale features since it is capable of image resolutions as low as 10 nm to accurately capture fine features on the surface of the wafer. The included software provides semi-automatic alignment and fast image capture as well as powerful image analysis algorithms which allow for highly precise measurement of all relevant features. Its specialized ergonomics and architecture enable users to move the wafer on different levels of accuracy and precision.The fast and precise wafer stage with redundant encoders allows for excellent control over the wafer stage in terms of rotation placement and translation. By mounting and unmounting the wafers quickly and easily TENCOR ALPHASTEP 500 ensures fast turn-around time and increased productivity. The system employs an automated scanning and imaging unit for a variety of analog and digital devices. The machine also includes a patented scanner that provides extremely fine resolution and accuracy, enabling the user to measure wafer details which are normally difficult or impossible to measure with other methods. The scanner utilizes motion control technology for precise positioning similar to that used in a plasma or electron beam lithography (EBL) tool. KLA ALPHASTEP 500 also features an advanced vision asset which allows for live inspection of each sample. This allows the user to easily monitor and troubleshoot any anomalies. The model offers data display and graphical representations of the wafer structure. All relevant data is stored digitally on the hard drive and can be archived for future analysis and reference. The equipment also provides comprehensive statistical analysis of each wafer's data allowing the user to determine trends, yields and other important metrics. In summary, KLA / TENCOR ALPHASTEP 500 is a highly advanced and precise wafer testing and metrology system. Its capabilities, combined with its user-friendly interface, allow for superior accuracy and sensitivity in determining the position, orientation and structure of nano-scale devices on a semiconductor wafer. It is an ideal tool for rapidly measuring complex structures and device components.