Used KLA / TENCOR Puma 9000 #9383061 for sale

ID: 9383061
Wafer Size: 12"
Darkfield inspection system, 12".
KLA / TENCOR Puma 9000 is a wafer testing and metrology equipment designed for semiconductor manufacturing applications. It is equipped with advanced metrology capabilities and is capable of providing a complete characterization of critical layers on wafers up to eight inches in diameter. KLA Puma 9000 comes with a variety of features designed to improve the accuracy and efficiency of the testing process, including automated scanning, fast repeat measurements, and a sizable field of view. At the heart of TENCOR Puma 9000 is its automated scanning capabilities. The system includes three-dimensional (3D) maps of all surfaces on the wafer that are created in real time as it travels across the wafer's entire surface. This process involves taking multiple measurements in a single location, allowing Puma 9000 to better detect and diagnose key features. KLA / TENCOR Puma 9000 also features an improved field of view, allowing even the most intricate features to be detected and analyzed effectively. KLA Puma 9000 also includes a fast repeat measurement capability, allowing it to quickly analyze multiple measurements and track changes over short periods of time. This feature helps engineers identify subtle defects and changes, saving both time and money by reducing the need for manual inspections. TENCOR Puma 9000 also offers an array of software capabilities designed to improve the accuracy and productivity of wafer testing and metrology. The unit's algorithms are designed to provide superior image quality, making it easier to accurately assess the critical elements on a given wafer. Further, the machine incorporates a powerful automation platform that makes it easier for engineers to develop and deploy complex testing routines with minimal effort. Finally, the tool offers post-testing analysis capabilities that enable engineers to quickly identify potential issues and correct them without the need for further testing. This feature helps improve speed, accuracy, and efficiency within the manufacturing process, dramatically reducing costs while improving product quality. In conclusion, Puma 9000 is a high-performance, feature-rich wafer testing and metrology asset that harnesses the latest in automated scanning, fast repeat measurement, and software-based analysis technologies to improve the accuracy and efficiency of the testing process. By reducing manual inspections, improving image quality, and offering post-testing analysis capabilities, KLA / TENCOR Puma 9000 is an ideal choice for those looking to improve their semiconductor manufacturing efforts.
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