Used KLA / TENCOR Puma 9150 #9210486 for sale

KLA / TENCOR Puma 9150 is a state-of-the-art wafer testing and metrology equipment designed for semiconductor processing applications. KLA Puma 9150 offers unrivaled precision and accuracy for wafer testing and inspection, enabling a wide range of wafers to be processed quickly and reliably. It is designed to meet the most extreme requirements for wafer testing and measurement, with best-in-class test time, repeatability and yield. TENCOR Puma 9150 utilizes a high-resolution, high-speed color imaging system with four sensors. This unit enables concurrent in-die measurement of each wafer layer and the overall wafer production. Puma 9150's advanced software and analytics provide detailed statistical data regarding the wafer's overall condition including surface roughness, defects, electrical properties, and other characteristics. KLA / TENCOR Puma 9150 also features an integrated automated defect inspection (ADI) machine. This tool allows for the automatic detection and identification of defects on wafers, as well as the ability to track their origin and cause. Additionally, the ADI asset can identify critical defects (such as those caused by process or equipment issues) quickly and accurately. KLA Puma 9150 offers a wide range of imaging capabilities, including photo emission, micro-scope, and thermal imaging. It also provides wafer measurement capabilities such as metrology, fast optical inspection (FTI), and wafer chipping. Additionally, TENCOR Puma 9150 is capable of ultra fast voltage testing, which allows acceleration of metrology tasks and process optimization. Puma 9150 wafer testing and metrology model is designed for flexibility and its modular design allows it to be easily integrated into standard production environment. It also supports a variety of languages, making it user-friendly and convenient for multiple users. Overall, KLA / TENCOR Puma 9150 is an excellent wafer testing and metrology equipment, offering accuracy, speed, and repeatability. Its advanced software and analytics make it an ideal tool for wafer processing applications. It can identify and measure even the smallest defects in wafers and provide detailed statistical data in a short amount of time, making it an invaluable tool in the semiconductor industry.