Used KLA / TENCOR RS-55TCA #9245519 for sale

KLA / TENCOR RS-55TCA
ID: 9245519
Resistivity mapping system SMIF.
KLA / TENCOR RS-55TCA is a wafer testing and metrology equipment designed to provide advanced, comprehensive analysis solutions for today's most demanding semiconductor manufacturing processes. With its automated alignment and robotic handling systems, it can meet the challenge of inspecting hundreds of wafers in a single batch. KLA RS55TCA is capable of measuring up to 8200 points per wafer across its entire surface area. The system is equipped with a motorized, fully automated, five-axis alignment unit that is capable of higher precision than many other systems currently available. It is able to accurately measure wafers with sizes of up to 200mm in diameter, as well as wafers of all thicknesses from 200mm to 500mm. Additionally, the machine is able to measure a wide range of wafer properties including thickness, flatness, surface tension, and electrical properties. TENCOR RS-55 TCA also includes a variety of advanced metrology tools, such as its BandViewer feature that permits advanced wafer analysis by comparing multiple wafers in real time. Additionally, it offers several advanced features, such as an on-board computer tool, which can store up to 4GB of data with up to 25,000 test records. It is also capable of authoring custom measurement programs and provides a graphical user interface for easy implementation of these programs. KLA RS 55 TCA also includes a unique quality assurance feature that is designed to guarantee the accuracy of the measurements taken. It also has a high-speed scan option that allows for faster turnaround times and helps minimize any process downtime. KLA / TENCOR RS 55 TCA is a highly versatile and advanced wafer testing and metrology asset that is capable of providing critical process insights for further yield optimization and cost reduction. It features a variety of features and is designed to deliver high accuracy and precision in testing in order to provide reliable data and results.
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