Used KLA / TENCOR SFS 7700 #170115 for sale

KLA / TENCOR SFS 7700 is an integrated wafer testing and metrology equipment designed for semiconductor manufacturing. The system is made up of a suite of products including optical and electrical measurement tools, advanced software, and configurations for a variety of customer-specific applications. The optical portion of the unit will include a SEM (Scanning Electron Microscope) for imaging and surface examination, an optical inspection microscope for taking x-ray or ultraviolet images, and a wafer mapping machine for mapping and imaging defect maps of wafer samples. The electrical portion of KLA SFS 7700 consists of contact probes, buck converters and current sources to measure electrical parameters across multiple devices at different voltages and temperatures. These electrical measurements enable users to measure voltage, resistance, current, capacitance, and similar parameters in order to assess the performance of semiconductor components and devices. TENCOR SFS 7700's sophisticated software suite is designed to help users calculate, store, and analyze the data collected by these instruments. This software will be able to locate, identify, and report wafer defects, as well as track wafer production and yield information. Additionally, users can configure their own customized macro commands to help simplify data management tasks. SFS 7700 can also be configured to perform specific tasks such as wafer defect evaluation, process monitoring, yield analysis, and data reporting. It provides users with a variety of features such as automated front end defect mapping, automated fault finding and diagnosis, user-friendly graphical user interface, and traceability and traceability support. Overall, KLA / TENCOR SFS 7700 is a powerful and comprehensive wafer testing and metrology tool. It is capable of providing highly refined and accurate measurements of semiconductor components and devices, helping to ensure the highest quality of product available to the consumer.