Used KLA / TENCOR SFS 7700 #9390450 for sale

KLA / TENCOR SFS 7700
ID: 9390450
Particle inspection system.
KLA / TENCOR SFS 7700 is an advanced wafer testing and metrology equipment designed to view, monitor, test and measure the electrical characteristics of semiconductor wafers. It is characterized by its high throughput, accuracy, sensitivity and reliability, and is built with highly advanced software and hardware components which enable it to deliver precise measurements that meet the demands of major semiconductor manufacturers. KLA SFS 7700 features a two-dimensional array of sensors, integrated into a dynamically stabilized motion table, that can precisely scan across the entire wafer surface. The device is equipped with automated structured light focusing optics that allow it to capture ultra-high resolution images, enabling it to measure electrical characteristics down to the nanometer level of accuracy. Additionally, the on-board Imaging Processing Core (IPC) provides real-time processing and analysis, allowing for rapid measurement and feedback. One of the most impressive features of TENCOR SFS 7700 is its Software Manager, which allows the system to automatically configure itself for different customer needs and applications. The Software Manager can easily detect the type of wafers the unit is analyzing and instantly adjust the machine's settings and parameters to ensure that the most accurate measurements are acquired. The combination of advanced optics, sensors, and sophisticated software allows SFS 7700 to provide manufacturers with extremely detailed measurements, essential for the demanding production requirements of semiconductor devices. The tool offers sophisticated data collection, analysis and visualization options, and its intuitive user interface makes it simple to use and operate. The dual axis motorized turntable, meanwhile, increases both efficiency and accuracy, enabling the device to rapidly scan and provide detailed analysis of multiple wafers in quick succession, while its expandable memory and vast input/output options give it the flexibility to accommodate virtually any design. In short, KLA / TENCOR SFS 7700 is a highly advanced wafer testing and metrology asset, capable of meeting even the most stringent requirements of semiconductor manufacturers. Its combination of state-of-the-art hardware and software components, combined with its unique software manager offers unmatched level of accuracy, efficiency and reliability and is the perfect choice for those looking to accurately measure the electrical characteristics of semiconductor wafers.
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