Used KLA / TENCOR SFX 100 #9236718 for sale

KLA / TENCOR SFX 100 is a powerful and advanced wafer testing and metrology equipment designed to deliver accurate and precise measurements, critical for maintaining product quality in a variety of high-tech industries. The system is typically used for a variety of process-critical government testing, semiconductor, and industrial manufacturing applications. The unit offers a wide-ranging set of tools for process and production control, enabling users to manage the complex and changing dynamics of production from machine-wide to individual wafers on the same device. A range of automated optics, tool functions, software, and sensors allows improved data collection, making the tool incredibly accurate and data-driven. Moreover, the asset is capable of collecting large amounts of data in seconds, reducing the time needed for process optimization. The optical tooling model in KLA SFX 100 can image single die and multiple die with varying size and geometries. It is designed to optimize data precision using imaging algorithms and can measure wafers of any thickness, size, shape, or material combination. It is equipped with advanced metrology tools for fast and accurate analysis, as well as automated process calibration. The equipment is compatible with many scanning electron microscope (SEM) and scanning ion beam (SI) tools. The system includes dedicated data management software, which allows users to store and access large datasets quickly and share results securely. In addition, the unit is equipped with automated software tools such as specialized algorithms for measuring very small features. The machine allows increased measurement accuracy due to the precise control of an automated optimization process. TENCOR SFX 100 provides users with a wide range of features and capabilities, allowing them to develop and optimize their processes in a cost-effective and accurate manner. This is essential for the production of reliable semiconductor parts and components, as well as for measuring the characteristics of complex and delicate circuits.