Used KLA / TENCOR SFX 100 #9244868 for sale
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ID: 9244868
Wafer Size: 12"
Vintage: 2013
Thickness measurement system, 12"
2013 vintage.
KLA / TENCOR SFX 100 is a highly advanced wafer testing and metrology equipment designed to help the semiconductor industry gain a better understanding of their materials. The system's capabilities include: 1. Total refractive index (TRI) measurements: This allows for an overall idea of the refractive index of a semiconductor material and is specifically designed for measurement of gallium arsenide (GaAs), indium gallium arsenide (InGaAs), and indium phosphide (InP). 2. Photoluminescence (PL) measurements: This measure gives insight into the electronic structure and energy landscape of a wafer, and can be used to understand physical phenomena such as quantum confinement and bandgap narrowing. 3. Raman spectroscopy: This provides information on the crystal structure of a semiconductor and the phonon modes of a material. Additionally, it can be used to monitor film growth at a molecular level. 4. Contamination and strain monitoring: KLA SFX 100 measures a range of defects caused by strain, contamination, or particle contamination for wafers, allowing for easier characterization of semiconductor structures. 5. Image processing: The unit is also capable of gathering image data, which can be useful for analyzing defects on the surface of a semiconductor, measuring critical dimensions and feature sizes, and studying electrical characteristics of a wafer. TENCOR SFX 100 is the ideal machine for the fast-paced semiconductor industry. It is designed to operate in an automated mode and provides detailed and accurate results in a quick and efficient manner. This helps to ensure that the industry is able to keep up with the demanding requirements of their customers. In addition to its advanced capabilities, the tool also features a user-friendly graphical user interface, making the data analysis process easier for operators. Overall, SFX 100 is a powerful tool for semiconductor testing and metrology. It is able to deliver accurate and reliable data quickly and with very little effort necessary, making it ideal for industry professionals. The asset also features a range of advanced capabilities, allowing it to measure both organic and inorganic semiconductor materials. This provides a great deal of flexibility and is more cost effective than manual measurements, making it the perfect tool for both industrial and research environments.
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