Used KLA / TENCOR Spectrashape 8810 #9384659 for sale

KLA / TENCOR Spectrashape 8810 is a high-precision wafer testing and metrology equipment designed for high performance optical metrology and inspection of reflectance and image quality for a variety of materials and applications. The system is equipped with a number of optical components, such as a Czerny-Turner spectrometer, a light source, a CMOS detector, and filters, to enable advanced optical analysis and measurement capabilities. The optical unit is designed with two separate optical paths that enable high-fidelity imaging of 2-dimensional images and the recording of spectra in real-time. It also features a high-accuracy precise stage and fast scanning speed, allowing for rapid execution of extended testing sequences on large areas of wafers. KLA Spectrashape 8810 can be used for a range of applications, including wafer defect assessment and inspection, non-destructive testing, defect location and analysis, optical characterization, and film thickness measurement. It also offers a range of automated measurement capabilities, including laser tracking, dark field imaging, and particle analysis. The machine's advanced software provides powerful quantitative analysis capabilities, allowing users to quickly assess film uniformity, coating uniformity, wafer warp, and other wafer defects, as well as enabling identification of clear, separate, and identifiable defect areas. Overall, TENCOR Spectrashape 8810 tool offers efficient, accurate, and reliable measurements for a wide variety of materials and applications. Its high-precision optical asset and automated test capabilities enable users to quickly and easily assess wafer structures and defects, enabling the development of new processes and technologies.