Used KLA / TENCOR Surfscan AIT #293807117 for sale
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KLA / TENCOR Surfscan AIT is a state-of-the-art non-destructive wafer testing and metrology equipment. It is capable of measuring the electrical characteristics and physical properties of wafers to ensure that they meet industry standards. The system works by employing advanced technology such as laser interferometry, laser beam defocusing and proce-sized displacement measurement. These technologies enable precise measurement of the surface topography and film thickness of the wafer, allowing for accurate die-level product quality assessment and yield maximization. The unit consists of three basic parts: The Wafer Chucker, the Probe and the Actuator. The Wafer Chucker is a precision instrument that holds the wafer to be tested in place and is used to transport it in and out of the machine. The Probe is a specialized manipulation device that is used to detect and measure electrical properties of the wafer, such as dielectric constant, electrical characterization, and sheet resistance. The Actuator is a precision motor-driven component that is used to move the probe over the surface of the wafer to capture and measure film thickness, profile depth, surface contrast, flatness, and other features. The entire tool operates through a computer controller, which provides a flexible and intuitive user interface. The computer controller also enables the asset to be easily configured to meet specific testing requirements. Additionally, the controller provides a comprehensive data storage and analysis model, allowing for the detailed review of test results. The equipment is designed to work with a variety of wafer sizes, thicknesses and materials, as well as varying levels of complexity in measurement applications. It is also capable of performing multiple memory tests at once, significantly reducing testing time. Its high accuracy and speed make it an ideal solution for semiconductor lithography applications. Overall, KLA Surfscan AIT is an industry-leading wafer testing and metrology system. It combines the latest technologies with a user-friendly interface, enabling fast, reliable and accurate results. Whether you are in the semiconductor industry or looking to develop new products, TENCOR Surfscan AIT is an ideal choice for your wafer testing and metrology needs.
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