Used KLA / TENCOR VM 1020 #9293536 for sale

KLA / TENCOR VM 1020 is a wafer testing and metrology equipment designed for defect review, measurement, and analysis. The system is based on an ergonomic, height-adjustable inspection platform, which supports up to four process modules, each featuring its own optics, electronics, and automation. The device is capable of processing a range of wafer sizes and shapes, including both standard and nonstandard sizes and configurations. KLA VM 1020 is equipped with advanced optics, including Fourier transform infrared (FTIR) imaging, high-powered imaging, confocal microscopy, digital image correlation (DIC) and automated focus calibration. The unit also features automated scanning, particle detection and analysis, and exact placement of defects on multiple layers of substrates. Specialized features, such as dual-beam laser interferometry, omnidirectional color-coded defect mapping, and "drop-off" of test data, ensure reliable metrology results. The machine has a comprehensive set of utilities and features, including enhanced data security, password-protected access, in-depth troubleshooting, and networkable software. A software development kit is available for experienced users to customize tool parameters, enabling deeper analysis. It is suitable for a wide variety of applications, including semiconductor production, chip testing, lithography, and bio-medical research. TENCOR VM 1020 is designed for fast, accurate, and repeatable measurements of wafers and substrate materials. Its advanced technology and intuitive user interface make the device easy to use, even for beginners. Its flexible design and configuration options make it the perfect choice for any in-process quality or research and development project.