Used KLA / TENCOR VP 10 #9226132 for sale

ID: 9226132
Wafer Size: 6"
RS Gauges, 6".
KLA / TENCOR VP 10 wafer testing and metrology system is a versatile, high-performance, and extremely accurate industrial metrology instrument for evaluating and characterizing semiconductor materials. KLA VP 10 is an advanced eddy-current inspection tool that uses a laser interferometer to measure physical properties of a wafer's surface, such as step heights, particle structure, and defect density. An integrated camera-based optical microscope allows for high-resolution process monitoring and defect diagnosis. The instrument is further optimized for automated operation with fast data analysis and reporting capabilities. At the heart of TENCOR VP 10 is a precision-crafted, thoroughly tested, and highly reliable laser interferometer. This interferometer utilizes a low-coherence, single-frequency laser that is coupled with a high-resolution camera array. The system then measures the optical path lengths of the wafer's surface, providing an incredibly accurate topography profile. An advantage of VP 10's laser interferometer is its ability to measure the properties of ultra-thin layers and thin films, such as photoresist and wafer thinning processes. As an all-in-one solution for wafer testing, KLA / TENCOR VP 10 also supports a range of advanced metrology tools. These tools enable the instrument to measure critical dimensions, defect densities, and uniformity of pattern features with high accuracy. It also features a wide range of sample holders that can accommodate samples of different sizes and shapes with ease. Finally, KLA VP 10's advanced data analysis software offers comprehensive and precise trend analysis of multiple wafers, providing a powerful tool for analyzing length data and reducing manufacturing costs. TENCOR VP 10 is a cutting-edge wafer testing and metrology tool that provides high-accuracy measurements and a wide range of powerful metrology tools. This makes it an ideal instrument for a variety of industries, from semiconductor device manufacturers to microelectronics factories. It is a reliable and efficient tool for gaining insight into the physical properties of wafers and thin films, making it a valuable tool for any business looking to optimize production.
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