Used KLA / TENCOR Zeta 20 ZFT #9307818 for sale

KLA / TENCOR Zeta 20 ZFT is a wafer testing and metrology system providing accurate and precise data for production-scale wafer inspection, analysis, and defect detection. It combines advanced inspection and metrology tools to deliver reliable results for high yields in semiconductor fabrication. The core components of KLA Zeta 20 ZFT include a powerful image digitizer, quantitative pattern recognition, a high-resolution digital camera, and advanced wafer mapping capabilities. The digitizer measures defects with high accuracy based on light intensity, pattern recognition algorithms identify projections of the defects, and the camera delivers high-resolution images so defects can be accurately determined. The advanced wafer mapping capabilities allow for the mapping of a wafer's surface in real-time and for the determination of the optimal orientation of the wafer for good inspection results. TENCOR Zeta 20 ZFT offers a variety of real-time scanning and metrology options including Auto-Compare/Auto-Analyze, Precision Analysis, Random Defect Detection, Critical Dimension Testing, and Z-Error Filtration. The Auto-Compare/Auto-Analyze feature provides quick defect mapping to determine the optimal placement for critical dimension measurements. The Precision Analysis mode offers rapid and accurate defect detection by creating high resolution images of sample slices. Random Defect Detection utilizes an algorithm to automatically detect and classify random defects on the wafer. Finally, Critical Dimension Testing provides high accuracy measurements for complex patterns to determine the critical dimensions of the feature. Furthermore, Zeta 20 ZFT utilizes advanced Z-Error Filtration to detect and filter out any unwanted information such as statistical variations, cross-wafer effects, electrical interference,and noise on the wafer. This ensures that high accuracy results when compared to earlier iterations of the technology. In summary, KLA / TENCOR Zeta 20 ZFT is a powerful wafer testing and metrology system designed to ensure high yields in semiconductor fabrication. It incorporates cutting edge image digitizers, pattern recognition, digital cameras, and advanced wafer mapping technology to deliver accurate results. It also offers many scanning and metrology modes to meet changing production needs. Lastly, advanced Z-Error Filtration technology further enhances data accuracy.