Used KLA / TENCOR Zeta Scan 280 #9293267 for sale

KLA / TENCOR Zeta Scan 280 is a wafer testing and metrology equipment for monitoring the fabrication of microelectronic devices, including semiconductor chips, thin films, and flat panel displays. It is a high-resolution imaging system designed to measure parameters, such as surface topography, film thickness, die height, and stress on a wafer substrate. KLA Zeta Scan 280 is an optical unit based on a state-of-the-art confocal microscope, equipped with advanced contrast sensitivity and extended depth of field capabilities. It features a 5-axis stage machine for fast, precise wafer handling. An intuitive graphical user interface allows the user to control wafer position, image capture and settings in one convenient location. TENCOR ZETASCAN 280 utilizes a light source, lensing, and filters to capture images of a wafer that are then digitized. The scanned images are analyzed by algorithms to extract values such as surface height, die height, film thickness, stress, etc. The data can be manipulated to generate a tabular display of results in the form of a report. KLA ZETASCAN 280 supports various metrology techniques, including brightfield, darkfield, as well as spectroscopic imaging. Scanning rates up to 60 images/second enable non-destructive, high-speed measurements of substrate parameters. Zeta Scan 280 is a powerful wafer testing and metrology tool, offering advanced imaging capabilities and high-speed data acquisition for monitoring the fabrication of highly intricate micro-devices. Its incredibly precise imaging capabilities, intuitive user interface, and unparalleled accuracy makes it an ideal choice for semiconductor manufacturers.