Used KOBELCO / LEO RPW-1000M #9384690 for sale

KOBELCO / LEO RPW-1000M is a powerful and reliable wafer testing and metrology instrument. With its advanced optical measurement equipment, this system offers submicron accuracy and repeatability. At the heart of LEO RPW-1000M is a back-illuminated CCD camera with a wide range of measurement formats, from full wafer to localized areas. The optical unit is coupled with a high-resolution stage for automated wafer scanning, helping to minimize misalignment. The stage also features vibration dampening for improved accuracy and stability. The machine features a sophisticated control panel that allows users to quickly and easily configure a wide range of wafer test and metrology parameters. It includes functions like precision grooving for defect analysis, as well as profile measurement, automated alignment adjustment, and precise wafer thinning capability. KOBELCO RPW-1000M is capable of measuring a wide range of features on bulk silicon wafers. Its advanced edge detection capabilities make it ideal for measuring electrostatic discharge on wafers with patterned and non-patterned features. It is also able to measure surface topography and imaging with up to 10x in both positive and negative directions. The tool can store up to 78 different user profiles and can recall them remotely for multi-station operation. With its advanced software, users can process large data sets in a fraction of the time of traditional methods, resulting in reduced throughput time. Supported by LEO customer support, RPW-1000M is designed to meet the needs of both research and production-level customers. The asset comes complete with a comprehensive library of software packages for automated wafer testing and metrology. With durability and reliability backed by extensive engineering, KOBELCO / LEO RPW-1000M offers excellent value and dependable performance.