Used KOBELCO / LEO SBW / LBW #293642522 for sale

KOBELCO / LEO SBW / LBW is a wafer testing and metrology equipment designed for producing high-resolution, low-power microelectronic devices. The system is based on laser-based scanning techniques, which allow for both extremely accurate measurements of physical properties of the device under test and software-based correction of any distortion caused by the device manufacturing process. The unit combines high-performance, high-resolution scanning platforms with a wide range of measurement software and hardware options, allowing users to tailor their wafer testing and metrology setup to their exact research and production needs. LEO SBW / LBW offers advanced laser scanning capabilities, allowing automated mapping of the entire device across a wide range of parameters. Its non-contact and non-destructive scanning offers a wide range of options for imaging, including various types of infrared and optical imaging. In addition, the machine also offers a wide range of associated software, allowing for automated data collection, analysis, and reporting. Its advanced software interface allows for easy customization of wafer mapping and metrology processes, including the integration of additional sensors and signals. The tool is designed for high-end production environments, ensuring the highest accuracy of measurement results, as well as fast and accurate programming of tests. In addition, the asset offers a range of features for reliability testing and analysis, allowing users to better manage their processes and reduce cost of ownership. The model offers both stand-alone and network-based connectivity, allowing for multiple devices to be connected simultaneously. This also supports remote monitoring of testing processes, allowing users to quickly and easily identify issues with their devices. KOBELCO SBW / LBW provides a wide range of advantages for users of all types and sizes, from universities and research facilities to industrial manufacturers. Its reliability, accuracy, and flexibility make it an ideal solution for designing, testing, and optimizing microelectronic devices.