Used KOCKS 4D Eagle #293605084 for sale

KOCKS 4D Eagle is a wafer testing and metrology equipment that enables manufacturers to characterize the electrical and physical properties of semiconductor wafers with an unparalleled degree of accuracy. This system is designed to measure and analyze a wide range of properties that are difficult to capture with other testing methodologies. It combines scanning electron microscopy, atomic force microscopy, electrical analysis, electrochemical analysis, and other techniques to measure characteristics such as dimensions, surface topography, electrical resistivity, gate leakage current, gate charge, charge to voltage, mobility, dopant concentration, and trap densities. 4D Eagle also provides a hot-spot detection capability, where it can locate defect-causing features and accurately analyze the characteristics of the material surrounding the area. This unit is based on a dual-beam profilometer, which can measure topographical features with high precision. This allows for the investigation of both small and large features on the wafer surface. Additionally, it can accurately measure the dopant concentration of the material. With this information, an appropriate process can be used to adjust the surface parameters to maximize device performance. KOCKS 4D Eagle also contains an advanced electrochemical analyzer which can measure the current flow through a material in order to characterize its electrical properties. This machine features an atomic force microscope which captures the physical parameters of the material at the nanometer level. It also is equipped with a scanning electron microscope to analyze the surface topography of the material. Finally, this tool also contains an integrated defect review asset which can detect defects and identify their characteristics quickly. This review model allows for the investigation of minute defects, as well as for the identification of their cause and action to take in order to address them. All these features make 4D Eagle one of the most complete and capable wafer testing and metrology systems currently available.