Used KOKUSAI VR-120/08S #9183022 for sale

KOKUSAI VR-120/08S wafer testing and metrology equipment is an advanced, automated system used for non-destructive wafer testing and metrology. The unit provides dynamic force and vacuum control with a dynamic tolerance range, allowing for high accuracy and precision measurements. KOKUSAI VR-120/08S utilizes a 40 cm diameter vacuum test head and three stepper motors to ensure contact between the wafer and the wafer test head. During the testing process, the stepper motors move the wafer test head to an exact X, Y, and Z position, while the dynamic force and vacuum control ensures constant and repeatable contact between the wafer and the test head. The dynamic force and vacuum control also ensures uniform and repeatable cooling of the wafer during testing. This, in turn, helps to achieve more accurate and precise measurements. KOKUSAI VR-120/08S machine is able to measure testing parameters such as wafer flatness and defects per layer, as well as defect types and locations. The tool also supports the use of 3D map inspection for defects and pits, allowing for rapid and repeatable testing on the wafer. KOKUSAI VR-120/08S utilizes a user-friendly Windows-based interface and features auto-triggering of the test head and data logging capability. The asset also features built-in data storage with every test, allowing for easy recall and sharing of test results with others. The user-friendly Windows-based interface and auto-triggering capabilities make it easy for operators to conduct wafer tests quickly and accurately. The dynamic force and vacuum control and repeatable cooling ensure accurate and precise tests, while the 3D map inspection feature further ensures accurate measurements of defects and pits. The model's data logging and storage capabilities also make it easy to share test results with others. In conclusion, KOKUSAI VR-120/08S wafer testing and metrology equipment is an advanced and automated system that provides exact X, Y, and Z positioning, highly accurate and precise measurements, and easy data sharing capabilities.