Used KOSAKA LAB ET 6100 #9293311 for sale

KOSAKA LAB ET 6100 is a highly versatile and efficient wafer testing and metrology equipment designed to handle most device types with a wide range of test environments. This system utilizes multiple technologies for measuring a variety of electrical and physical properties, providing reliable results with excellent repeatability and accuracy. ET 6100 is capable of inspecting and analyzing wafers, chips, and packages for functionality, electrical measurements, and physical properties. KOSAKA LAB ET 6100 includes an advanced optical microscope providing high-resolution imaging for sample characterization and defect inspection purposes. It is also equipped with a projecting micro-bevel optical microscope, enabling both front side and back side imaging of wafers and other components. The unit is capable of testing a wide range of electrical parameters. These include: electrical continuity testing and insulation resistance testing. The electrical parameters can be measured for both individual die and integrated circuits. Additionally, ET 6100 can automatically recognize and measure the specific features of various kinds of components. This highly efficient machine is equipped with an advanced optical microscope and built-in camera for image capture. When it comes to physical properties testing, the tool employs a variety of techniques, such as spectral analysis, vacuum testing, and surface texture analysis. In terms of spectral analysis, the asset is equipped with a spectrophotometer that provides highly accurate measurements of spectral properties. The vacuum testing option provides data on thermal properties, leakage current, and other microstructural characteristics. Finally, surface texture analysis is used to measure roughness, friction coefficient, and other tactile properties. Additional features of KOSAKA LAB ET 6100 include an open platform software that enables data to be shared with other processes, including automatic general report generation. It is also capable of multiple destructive and non-destructive testing sequences, as well as providing data for statistical process control. Furthermore, the model is designed with advanced test automation capabilities, allowing easy and efficient operation by operators. ET 6100 is ideal for high-precision wafer testing and metrology, providing excellent precision and accuracy in a variety of applications. It is capable of providing reliable and repeatable results with multiple techniques and is highly efficient with its open platform software and automated testing capabilities.