Used KVM 4030C #293651246 for sale

KVM 4030C Wafer Testing and Metrology Equipment is a state-of-the-art wafer testing and metrology system ideal for semiconductor and flat panel applications. This unit offers reliable, accuracy, and repeatability of data across the entire wafer testing process from sample testing to the end-of-life. 4030C enables both voltage and current probing capabilities. This allows for testing of both parameters simultaneously. The machine also offers a multi-frequency and multi-phase combination option for more accurate and reliable data collection. This makes for a comprehensive testing and metrology tool. KVM 4030C comprises of various subsystems, such as Probe Chamber, Measurement Block, Signal Processor Unit (SPU) and Scanning Electronics. The Probe Chamber is equipped with an Automated Loading and unloading asset, allowing for faster loading, unloading and handling of wafers. The Measurement Block houses the alignment stages, a Multi-Frequency and Phase Control systems, and a Multi-channel Computer Control Interface. The Signal Processor Unit is a high-speed digital data acquisition model that enables accurate and precise measuring of voltage and current parameters. The Scanning Electronics comprises of a CCD camera, digital signal processing, and an XY table, allowing for precise and efficient wafer scanning capabilities. 4030C is engineered for improved throughput and accuracy and is capable of testing a wide range of wafer sizes, ranging from 5-inch up to 12-inch. Its precision stages and probe cups with extending fingers allow for adjustable probe head and enables users to test near-to-edge regions. It also offers automated probing between 40-100 probes. The equipment is capable of wavelength scanning from 240nm to 850nm, with multi-phase and multi-frequency values up to 5 kHz. KVM 4030C offers ease-of-use and is compatible with a wide range of software programs and control languages, such as C++, C#, WinForms, Agilent's BenchLink Pro, and Measurement Studio to allow for easier programming, testing, and data collection. In summary, 4030C Wafer Testing and Metrology System is a comprehensive, easy-to-use unit ideal for semiconductor and flat panel applications. It offers high-precision, reliable data across a wide range of wafer sizes, and is compatible with a variety of software programs and control languages.