Used KYOWA DMS-401 #9314403 for sale

KYOWA DMS-401 is a wafer testing and metrology equipment designed for advanced device characterization and failure analysis. It combines advanced metrology with next-generation testing capabilities to deliver unprecedented accuracy and precision, allowing users to gain a deeper understanding of a device during the development process. The system is equipped with a full suite of optical microscopy (OM) capabilities, enabling high-resolution imaging and precise measurements of physical features such as pads and bumps. The unit also features electrical test systems, including impedance analyzers and vector network analyzers, and laser profilometers for accurate dimensional measurements. DMS-401 is highly customizable, allowing users to tailor the machine for specific applications or processes. It also features a number of advanced features, such as support for multiple test protocols, automated analysis and report generation, and real-time feedback on test results. KYOWA DMS-401 offers a host of advantages over traditional methods of wafer testing and metrology, such as higher accuracy, faster testing times, and increased test flexibility. It also enables automation of many routine tasks, saving time and resources. In addition, the tool is easy to use, as it has a user-friendly graphical interface. DMS-401 is ideal for use in research and development, quality assurance, manufacturing, and failure analysis. It is also well-suited for a variety of industries, such as microelectronics, semiconductors, packaging, and biomedical engineering. This asset is a highly versatile and cost-effective solution for device characterization and failure analysis, and its advanced capabilities make it an invaluable tool for customers in a wide range of technical fields.