Used KYOWA PCD-300B #9259529 for sale

KYOWA PCD-300B
ID: 9259529
Resistivity measurement system.
KYOWA PCD-300B is a multifunction wafer testing and metrology equipment that provides the greatest level of accuracy, flexibility, throughput, and performance. It features a dedicated, high-resolution optical microscope with an auto-focus system that can quickly inspect wafers with a repeatable accuracy of 1μm or better. PCD-300B provides up to 500μm of substrate probing for various wafer testers. Additionally, it has a powerful vision unit that can detect both general and fine defects. KYOWA PCD-300B is equipped with an advanced wafer manipulation machine that can handle rather large and flexible substrates with up to 300mm x 300mm of area. Its quick and precise motion enables efficient wafer loading, gripping, and positioning. The tool also supports a wide range of wafer carriers such as cassette, FOUP, and MAP. PCD-300B offers a powerful metrology asset designed to precisely measure thin wafers. It is equipped with a laser interference microscope that allows the model to measure flat surfaces with an absolute accuracy of 97.5nm. It also enables the measurement of both forward and backward shallow-trench isolation (STI) structures. The equipment also features an interferometer that accurately measures the shape of lands and trenches on the wafer with nanometer precision. Furthermore, KYOWA PCD-300B offers an extensive library of measurement recipes that engineer can quickly integrate into their processes. The process-optimized recipes ensure accurate measurement of sophisticated wafer features by reducing the overall time required for testing and metrology. The recipes are compatible with the leading fab software packages, and can be quickly and easily deployed via a LAN connection. In conclusion, PCD-300B is an advanced and versatile wafer testing and metrology system designed to provide the highest level of accuracy, flexibility, and performance. It is equipped with a powerful metrology unit, a dedicated optical microscope, and a wafer manipulation machine that can handle a variety of substrates. Additionally, the tool is designed with a library of pre-defined recipes for process optimization, and is compatible with the leading fab software packages.
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