Used LASERTECH BI100 #9399314 for sale

LASERTECH BI100 is a wafer testing and metrology equipment created to process a variety of wafers with ease and accuracy. The system features five metrology tools that are tailored for a wide array of sample analysis. The unit can complete critical-dimension (CD) tests, line-width measurements, overlay registration, surface roughness assessments, and many other wafer measurements. The machine is built with high quality components, ensuring accurate and reliable performance. LASERTECH advanced confocal technology allows the tool to achieve resolutions up to 0.5 nm, with a tested repeatability of 1 nm. This precision level is essential, considering the nanometer sizes of most wafers today. The asset is also built with an adaptive obscuration feature that accounts for varying wafer geometries, allowing it to remain accurate with different chip designs. The model is able to process up to 300 wafer samples per hour in a single equipment, with up to two samples per online and up to eight samples per batch—making it perfect for high-throughput environments. Additionally, the system is highly scalable, and can be easily adapted to stretch the workload capabilities per hour, with the addition of additional metrology tools. The software developed at LASERTECH is intuitive and easy to learn, allowing users to quickly set up and analyze samples quickly and accurately. The interface is user-friendly, allowing for macros to be created for repetitive tasks. Additionally, the software comes pre-loaded with dozens of pre-configured procedures to help streamline the analysis process. BI100 is a top-of-the-line unit for wafer testing and metrology. Its maximum resolutions achieved and its intuitive software make it perfect for modern advanced wafer measurements. The machine is highly capable and easily scalable, offering tremendous value for users across the spectrum.