Used LEHIGHTON 1500-RS #293663340 for sale

LEHIGHTON 1500-RS is an advanced wafer testing and metrology equipment designed to deliver accurate and reliable measurements of thin films, substrates, and other semiconductor materials. The system is capable of measuring thickness, surface roughness, reflectance and other electrical properties with high accuracy. Built using state-of-the-art laser interferometry techniques, 1500-RS is a powerful tool for measuring thin films and substrates down to sub-micron resolutions. LEHIGHTON 1500-RS utilizes a non-contact optical metrology unit which means the interface between the wafer/material and the probe is not required for testing. This eliminates the need for forming a seal between the wafer and the probe which is critical for conventional contact metrology. Thus this machine can measure thin films and substrates under a variety of conditions, such as on rotating substrates or in the presence of uncontrollable contaminants. The tool is also compatible with a wide range of substrate materials, including polysilicon, silicon nitride, polycrystalline oxide, germanium, gallium arsenide, and III-V compounds. Additionally, 1500-RS is able to measure film thickness down to 0.1nm, making it suitable for measuring sub-micron thin films and surfaces. The asset is also optimized for testing highly reflective non-metallic surfaces as well as heavily textured and patterned materials. LEHIGHTON 1500-RS model is powered by an ultra-fast control equipment, and is able to measure a wide variety of parameters with speed and accuracy. It also features an intuitive user interface, which makes it easy to set up and program sophisticated measurement sequences. The integrated analysis software makes it possible to quickly analyze and interpret the results, which can be visualized as graphs, histograms, and other data representations. 1500-RS is a highly powerful and reliable wafer testing and metrology system, and is suitable for various applications such as evaluating the quality of thin substrates for semiconductor devices, measuring surface roughness, and evaluating the composition of electronic thin films. This unit is guaranteed to deliver excellent performance and accuracy, allowing for quick and precise testing of thin films and surfaces.