Used LEHIGHTON 1510B SA #9083756 for sale
LEHIGHTON 1510B SA is a wafer testing and metrology equipment developed by LEHIGHTON Technologies Corporation. It is designed to provide comprehensive information about a wafer's characteristics such as topography, surface finish, and grain structure. It has a flexible range of application possibilities due to its ability to measure in both 2D and 3D with high precision. The system is designed for all types of wafers and is suitable for short-term and long-term testing projects. It is highly reliable, with an accuracy of up to 3.5 nm resolution in height measurements, and 4.3 nm in the x- and y- dimensions. The traveling range of the unit is controlled by a stage-coordinate manipulator and the measurement resolution can be set up to 0.1 μm. The computer machine is Windows 10 based and is equipped with a touchscreen display and control panel. 1510B SA has several features which make it an ideal choice for testing wafers. It is capable of measuring wafer topography, surface finish, grain structure, and other features. It offers a high scanning speed of up to 20μm/s and quick positioning for fast testing of many different wafers. Additionally, it supports non-contact metrology for surface finish and roughness measurements. The tool can also be used for reverse engineering and can be integrated into a complete process control asset. It is capable of producing a range of images, such as those used in FIB-SEM, including atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy. The model is also equipped with an auto-calibrator and provides real-time analysis and feedback for better wafer testing and analysis. LEHIGHTON 1510B SA also supports non-contact wafer testing and traceability. It has up to five programmable wafer orientations, which can be set according to the needs of the user. The equipment is equipped with statistical software for data analysis and can generate 3D images to help in wafer evaluation. Overall, 1510B SA is a high-performance wafer testing and metrology system, designed to provide comprehensive information about a wafer's characteristics. It is capable of measuring a wide range of features, offers a high scanning speed, and is equipped with statistical software for data analysis. This makes it ideal for reverse engineering and process control systems, as well as for providing traceability and non-contact testing.
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