Used LEHIGHTON 1510C-RP #293608868 for sale

LEHIGHTON 1510C-RP wafer testing and metrology equipment is a high-precision metrology tool designed for use in semiconductor wafer processing and inspection. This system enables manufacturers and testers to analyze and measure various properties of wafers, as well as detect contamination and defects. 1510C-RP is a fully automated stand-alone unit that can accurately inspect and analyze the physical properties, electrical properties, and optical characteristics of all types of semiconductor wafers up to 12″ (300 mm) in diameter. It combines a range of specialized sensors and optical microscopes, along with a data acquisition machine, to quickly and accurately measure a variety of characteristics of a wafer without requiring any operator intervention. LEHIGHTON 1510C-RP supports a range of wafer probes and substrate materials, such as Silicon Oxide, Silicon Nitride, Silicon Carbide, Oxygen-doped Polysilicon, and Heavy Metal Silicon Oxide. Additionally, the tool can be configured to detect a range of defects and contaminants, such as particles, residue, contamination, defects, and more. This ensures high-quality results and ensures the wafers are safe for further processing. 1510C-RP also supports a comprehensive range of testing modes, including non-destructive and destructive tests and a variety of failure analysis techniques. LEHIGHTON 1510C-RP includes two independent and interchangeable platforms, one for inspecting and one for characterization. The inspection platform performs the most basic and critical testing tasks, such as focus height and critical dimension measurements, while the characterization platform runs more specialized tests, such as capacitance measurements and carrier mobility testing. This allows users to configure and flexibly adapt the asset to suit the particular needs of their application. Additionally, 1510C-RP offers a wide range of features to simplify the testing and metrology process, such as automated wafer handling, continuity checks, automated data acquisition, and remote access control. This helps to reduce overall testing time and increase accuracy. LEHIGHTON 1510C-RP is the perfect solution for manufacturers, testers, and researchers looking for a reliable, high-performance wafer testing and metrology model. Its wide range of features and multi-functional capabilities provide an ideal platform for both basic wafer inspection and complex analysis tasks. Moreover, its cost-effectiveness and simple operation make it an attractive choice for laboratories and production facilities alike.