Used LEHIGHTON 1510E-RP #9288297 for sale

LEHIGHTON 1510E-RP is a wafer testing and metrology equipment designed for advanced and accurate measurements of thin film structures. It has a modular approach that supports a variety of electrical, optical and acoustic measurements, as well as ultra-high vacuum (UHV) compatible deprocessing capability. It features a prober-based platform built on a 3-axis X-Y-Z stage for precise and accurate positioning. The prober works in conjunction with an advanced metrology cube, together providing access to a wide range of measurements and parameters. The advanced metrology cube combines a laboratory-grade atomic force microscope (AFM) with a scanning electron microscope (SEM) and an ellipsometer. This combination allows for quantitative measurements of a variety of thin film structures, including deposition density and surface coverage. While SEM and AFM provide valuable insight into the structure of the thin film, the ellipsometer allows a user to measure thin film thickness more accurately. Additionally, this is system is equipped with an STM tip furnace, allowing for UHV compatible deprocessing of samples. 1510E-RP unit is capable of data acquisition, calibration and analysis to provide comprehensive analysis of thin film structures. The machine is equipped with a variety of software tools for data processing and analysis for a wide range of substrates. It can be integrated with a variety of software utilities for quick and efficient processing, to help provide fast insights and results for a variety of thin film related experiments. LEHIGHTON 1510E-RP wafer testing and metrology tool has a user friendly interface, with intuitive menus and graphical displays. With its automated features, it is easy to set up and use, making this asset suitable for both beginners and experts. Additionally, it is can be operated remotely over an Ethernet connection, making it a versatile tool for researchers and commercial users alike. Overall, 1510E-RP wafer testing and metrology model is a user friendly, modular and versatile platform for analyzing thin film structures. With its complex combination of hardware and software, it provides comprehensive analysis of a variety of thin film related experiments. It is suitable for both experts and novice users, and can easily be integrated with a variety of software and remote operating tools.