Used LEHIGHTON 1610 #293606944 for sale

LEHIGHTON 1610
ID: 293606944
Non-contact measurement system.
LEHIGHTON 1610 is a wafer testing and metrology equipment for measuring wafer characteristics. It is designed for hundreds of different geometrical properties and inspection parameters. The system from Leybold is highly efficient and cost-effective, making it ideal for both research and production applications. The LTE 1610 is designed with a modular unit which allows for flexible configuration that matches the customer's needs. The machine is highly accurate and repeatable, providing results with two decimal places of precision. It includes components such as beam phases, amplifiers, optics heads, rotating stages, motors, and controllers. The device is engineered to evaluate numerous characteristics of semiconductor wafers, such as surface contours, axial areas, and further dimensions. It is also capable of measuring a wide range of material properties, including dielectric constants, stress fields, and refractive index. The device utilizes a light beam generator and a nanometer-scaled detector for precise and accurate measurements. LEHIGHTON 1610 tool also features an interactive GUI with 3D process view, allowing users to see the whole process at a glance, create easy to use flow diagrams, and to control the process. It also features unlimited storage, automatic results storage, defect image capture, and an external high-resolution encoder with optional software expansion. The experimental software and algorithm of 1610 are designed for high precision and speed. Advanced measurement capabilities include "multi-device and multi-data channel synchronization" and "data channel pixel scale". Additionally, the asset supports single-image processing, seamless integration with multiple PL/TW systems, and FIB/SEM control. In summary, LEHIGHTON 1610 is a powerful and reliable wafer testing and metrology model with powerful capabilities. It is a modular equipment, with an interactive GUI, advanced experimental software and algorithm, multi-device synchronization, and further features. It is a great choice for both production and research applications, providing fast and accurate results.
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