Used LEICA LTD 800 #9278377 for sale

LEICA LTD 800 is a state-of-the-art wafer testing and metrology equipment designed for semiconductor production lines. It provides an efficient and accurate solution for the detection and measurement of defects in a variety of substrates, including silicon, quartz, aluminum, and ceramic. The system is composed of a high-resolution optical microscope, a sampling head, and specialized software for image analysis. The microscope is equipped with a high-resolution digital camera for imaging and scanning of wafers. The sampling head includes a 90-degree rotation and tilt mechanism, allowing it to precisely capture multi-angle images of wafer surfaces for accurate defect detection. The microscope also incorporates up to four individual objectives to perform analysis at different magnifications, enabling measurement of both large and small defects. The software used by LTD 800 provides a number of features that allow precise defect detection and measurement. The unit provides a variety of image enhancement algorithms to enhance contrast and enable better defect definition. Additionally, it provides an automated defect detection mode, allowing it to automatically detect and measure defects based on preset criteria. The machine also comes with a specialized scanning mode for checking of wafers with uniform patterning or thin films. This mode includes algorithms to detect and measure various types of defects based on image analysis. The tool also offers 3D visualizations of the wafer and the defects, ensuring improved accuracy and easier defect localization. Finally, LEICA LTD 800 also provides a range of reporting and archiving capabilities, allowing users to store and easily retrieve the results of inspections. The asset is also expandable, with compatibility with other systems and support for additional accessories. These features provide users with a comprehensive solution for defect detection and metrology in semiconductor production lines.