Used MICROTRAC Belsorp-mini X #293592486 for sale

MICROTRAC Belsorp-mini X is a wafer testing and metrology equipment designed for non-destructive measurement of thin wafer substrates. Its accuracy and speed provide users with real-time measurements and results, without the need for sample preparation and cleaning. This powerful and versatile tool is ideal for research and development labs, as well as production and quality control applications. Belsorp-mini X offers a variety of capabilities for wafer testing, including static and dynamic testing, surface profilometry and 2D image analysis. For static testing, the unit is capable of measuring wafer flatness (baseline flatness) and cylindricity (roundness and smoothness of the curved surface) with highly accurate measurements. It also includes the ability to measure ISO tolerances, as well as a function for performing profile scan and profile edge extraction, which can help identify any irregularities on a surface. The dynamic testing feature of MICROTRAC allows users to measure the thickness/noise ratio, as well as the static mechanical properties of wafer substrates. From these measurements, users can gain an understanding of the wafer's elasticity and stiffness. Additionally, the unit's surface profilometry capabilities allow users to measure flatness and peak-to-valley distances on different surface contours. MICROTRAC Belsorp-mini X also features optical metrology capabilities, enabling the system to measure surface roughness, edge radius, corner angle and other shapes of a wafer substrate with a high degree of precision. The optical technology includes a 2D imaging unit, which provides a visual image of the wafer's surface; this allows users to quickly assess the wafer's profile, irregularities, and other factors. The machine also features a 12.7-megapixel digital camera and a specialized objective lens for maximum image quality. To ensure accuracy, Belsorp-mini X also includes sophisticated software functions. This includes MetisPaint software, which provides interactive visual navigation and analysis, as well as various measurement technologies, such as the Python Loop Theory, which helps to provide accurate metrology results. Overall, MICROTRAC Belsorp-mini X is an advanced wafer testing and metrology tool that allows users to perform non-destructive testing of thin wafer substrates with high accuracy. Its powerful abilities and advanced optical technologying systems make it an ideal tool for research and development labs, production and quality control applications.