Used MICROTRAC Nanotrac Wave II #293592491 for sale

MICROTRAC Nanotrac Wave II is a powerful, multi-functional wafer testing and metrology equipment. This advanced system offers precision measurements to capture various physical and electrical characteristics of devices and components. The unit combines several technologies, including optical, mechanical and electrical, to measure the electrical, mechanical, optical and tribological characteristics of nano and micro-scale materials - from wafers in a single machine. It can simultaneously measure nano-scale structure, surface topography and electrical characteristics of individual devices or components. The tool supports a variety of techniques, including Electrochemical Profiling, Current-Voltage Profiling, Atomic Force Microscopy, Scanning Electron Microscope, Optical Microscope and Light Trapping. This wide range of measurements can detect variations and defects on wafers more accurately. Nanotrac Wave II also offers advanced automation capabilities. The asset has an auto-correction feature to adjust parameters, as well as an automated wafer handling feature to improve throughput. It also offers dual wafer loading capability, enabling users to measure two wafers in a single session. MICROTRAC Nanotrac Wave II is designed for both research and high-volume industrial applications. It features a range of accessories that can be configured to meet the exact requirements of each application. These accessories include a low-volume loading and unloading model, auto-docking station, and more. In summary, Nanotrac Wave II is a highly-functional wafer testing and metrology equipment that offers a wide range of capabilities. It combines advanced technology and automation to ensure precision measurements of nano and micro-scale materials. This system offers an excellent solution for both research and high-volume industrial applications, being configurable to suit any customer's needs.