Used MICROTRAC S3500 #9222240 for sale

MICROTRAC S3500 is a state-of-the-art wafer testing and metrology equipment designed for measuring the physical, electrical, and geometrical characteristics of semiconductor wafers. The system uses a complete suite of characterization techniques to accurately measure wafer features with high resolution and precision. These techniques include 3D optical scattering microscopy, capacitance profiling (CP), and electrical scanning microscopy (ESM). The highly integrated software capabilities of the unit automate the measurement and analysis procedure, reducing user required effort, minimizing costs, and maximizing quality assurance. The machine's user-friendly software interface makes advanced metrology and measurement processes simple and easy to execute. For optical scattering microscopy, MICROTRAC S 3500 has an automated image analysis which quickly and accurately measures profiles of topography, surface roughness, step heights, grain boundaries, and edge curvature. The integrated CP technique applies a voltage grid pattern to the wafer's surface and collects electrical data related to the thickness of the silicon oxide layer, the wafer topography, and the profile of the silicon nitride gate dielectrics. This data then helps to provide vital information regarding surface quality, uniformity, feature shape, and other critical device parameters. The ESM technique uses a scanning direction to measure electrical conductivity across the surface and obtain data on various defects and irregularities. This technique also has an automated defect detection feature that can analyze images and detect displacements with high precision. Overall, S3500 is an ideal solution for advanced wafer testing and metrology. This tool allows users to quickly and accurately analyze and characterize semiconductor wafers and provide highly accurate data that can be used to optimize manufacturing processes, improve product quality, and ensure device reliability.