Used MICROTRAC S3500 #9258846 for sale

MICROTRAC S3500 is a state-of-the-art wafer testing and metrology equipment used in the semiconductor industry to measure and analyze micro-scale structures. The system combines a broad range of metrology methods, both destructive and non-destructive, to ensure high-precision characterization of micro-scale structures that are used in the fabrication of integrated circuits. MICROTRAC S 3500 is a multi-axis scanning unit configured with an XYZ linear drive machine, high power lighting, and an imaging tool capable of capturing multiple types of data, including optical, electrical, thermal, and acoustic. The optical imaging asset allows researchers to capture images of microscopic structures on wafers at resolutions up to 4µm. It uses both bright-field and dark-field imaging techniques for maximum visibility of structures. The electrical measurements use DC and AC current and voltage sources to measure conductivity, breakdown, and contact resistance. The thermal components measure the temperature of wafer structures, enabling researchers to accurately analyze the thermal properties of various materials. The model also includes a comprehensive suite of software specifically designed for metrology applications. The software offers a range of data analysis and modeling capabilities, from basic parameter calculation to advanced 3D mapping and defect-level simulations. This allows researchers to quickly analyze their data and gain insights into critical characteristics, such as line widths, contact resistance, and thermal conductivity. S3500 is an indispensable tool for the semiconductor industry, helping researchers design, analyze, and optimize advanced micro-scale structures. Its powerful combination of hardware and software enables researchers to measure, analyze, and visualize intricate structures with unprecedented levels of accuracy and precision.