Used MICROTRAC Zetatrac #9215442 for sale
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Nanotechnology particle size With charge measurement analyzer (2) Solid-state diode lasers: Wavelength: 780nm Maximum optical output power: 5mW Volume: 0.7 ml-3 ml pH Range: 2 -12 Particle size range: 0.8 Nanometers - 6.5 Microns Scattering angle: 180º Temperature: 10ºC to 80ºC Environmental: Temperature: 10ºC to 40ºC Humidity: Up to 90% non-condensing Zetapotential: Particle size range: 10 Nanometer to 20 Micron Concentration: 0.01 % min to 40 % max Range: -125 to +125 mV Accuracy: 3.8 mV Electrophoretic mobility Range: -10 to +10 m/sec/volt/cm Accuracy: 0.3 m/sec/ volt/cm Chemical compatibility Wetted surfaces includes metal and oxide electrodic surfaces Delrin Teflon Sapphire Aqueous Solvents Power: AC-DC Power supply: 100-240 VAC, 47-63 Hz, +5VDC1% Maximum power: 10W 2010 vintage.
MICROTRAC Zetatrac is a high-precision wafer testing and metrology equipment designed for semiconductor and solar cell manufacturers. This system offers a range of automated, non-contact metrology equipment, capable of measuring electrical parameters such as sheet resistance and current-voltage characteristics, as well as physical parameters such as thickness and profile. Zetatrac features an advanced optical microscopy unit, with a 100x zoom capability, and a high-resolution sensor with a 0.6 micron accuracy, to provide accurate measurements of device parameters. MICROTRAC Zetatrac is designed to provide an efficient and cost-effective testing solution for production as well as research. The machine features software that provides automatic alignment and data processing, and with its 16-bit camera and analytical optics, the tool can provide quicker and more accurate measurements than traditional methods. This asset also includes an intuitive control interface, allowing users to quickly operate and analyze the model from virtually any device. Zetatrac can be used for a variety of tasks such as testing for defects and contamination on substrates, controlling substrate uniformity, generating uniform patterned structures, and determining device performance. It is also capable of measuring a variety of parameters such as widths, lengths, pitch and step sizes, resistivity, and profile measurements at high accuracy. The equipment includes a unique metal/oxide deposition module, allowing users to depositing up to 70 nm of metal or oxide quickly and at a minimal cost. In addition, MICROTRAC Zetatrac utilizes an integrated power supply and software control system, allowing users to quickly adjust to different test requirements without the need for external power supplies or complex external programming. The unit is able to easily interface with other instruments, processes, and databases, making it a great tool for both small-scale and large-scale production. Zetatrac has the capability to provide fast and accurate measurements for a variety of substrates and device types. It has been designed with both efficiency and accuracy in mind, allowing users to quickly and effectively analyze substrates and devices. This machine is ideal for any application that requires high-accuracy testing and metrology.
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