Used MITUTOYO SJ-201 #9245763 for sale
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MITUTOYO SJ-201 is a Wafer Testing and Metrology equipment that is designed to measure the performance of a wide range of semiconductor components and materials on a single platform. The system is specially designed to provide wafer makers with a reliable and accurate way to monitor their wafer production. This unit utilises the latest advances in digital image processing and metrology technology to automatically and precisely measure the characteristics of each individual wafer in a fast and efficient manner. SJ-201 machine includes a scanning electron microscope stage, digital imaging tool, and device measurement tools. The imaging asset and device measurement tools have been designed to be intuitive, allowing users to quickly analyze and save data in real time. The model features the ability to display, preview, and save the data collected from these measurements. MITUTOYO SJ-201 also includes templates for quick wafer-to-wafer comparison and allows users to export the data as PNG or JPG format files. The tool's scanning electron microscope stage can measure down to nanometer resolution, providing highly precise results. This equipment is also equipped with a number of imaging and metrology functions, such as alignment, size and shape measurement, focus enhancement, and brightness adjustment. Additionally, it also features an automatic measurement mode, which allows the users to quickly take multiple measurements and save times drastically. The advanced imaging and metrology features of SJ-201 make it ideal for wafer testing and metrology applications. It provides a complete solution for monitoring wafer production from start to finish while delivering reliable and accurate results. The intuitive user-interface and wide array of features make this system ideal for wafer makers and testing services alike. MITUTOYO SJ-201 unit is a cost-effective solution that will help increase the speed and accuracy of wafer production, while reducing downtime, costs, and production overruns.
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