Used MITUTOYO SJ-210 #9245762 for sale

MITUTOYO SJ-210 wafer testing and metrology equipment is designed to provide accurate metrology measurements for all stages of semiconductor device development. It can be used to measure wafers before and after etching or depositing in fabrication processes, as well as for final process inspection and quality control. The system is designed to work with a range of wafer sizes from 25mm to 200mm. It has a non-contact vision unit with multi-point scanning capabilities for improved accuracy and repeatability. SJ-210 uses a two-axis stage that is capable of supporting wafers up to 589mm in size and has a movement range of X=125mm and Y=300mm. The machine has an integrated high-performance 6-axis robot for sample handling, and can accommodate both standard and custom handling fixtures. MITUTOYO SJ-210 tool also has a high-resolution CCD camera and a 4-axis manual stages for positioning and fine-tuning measurement accuracy. The asset comes with a suite of measurement tools that include digital imaging, surface profiling, non-contact measurements, and pattern recognition. For non-contact measurements, the model uses a laser interferometer for displacement, vibration, and acceleration measurements. It also includes a variety of measuring probes for deformation measurements. SJ-210 is capable of detecting and plotting patterns of trapezoids, rectangles, arcs, circles, and other shapes to help engineers and scientists measure and analyze edge or surface profiles accordingly. Additionally, the equipment can measure multiple characteristics of a wafer such as overall size, thickness, surface roughness, step height, and flatness. MITUTOYO SJ-210 wafer testing and metrology system offers users an efficient and versatile tool for conducting metrology and process inspection. Its suite of measurement tools enable engineers and scientists to perform fast and accurate measurements on a variety of wafer sizes, providing comprehensive insight into wafer processing.