Used MITUTOYO SJ-301 #293616958 for sale

MITUTOYO SJ-301 is a wafer testing and metrology equipment designed for measuring challenging features on semiconductor wafers and other large surfaces. The system is capable of scanning large wafers and measuring the shape, size, height, and other features of their components. The unit can also measure electrical parameters such as resistance, capacitance, and inductance. The machine is equipped with an ultra-high speed CCD-based inspection sensor, which allows for high-precision and high-speed measure on various surfaces. The sensor is equipped with multiple cameras, making it suitable for measuring extremely small areas with a resolution of less than 100 nanometers. The tool is also equipped with an advanced metrology solution which is capable of measuring extremely small distances without relying on a mechanical ruler. SJ-301 also offers a 3D virtual tracking routine which allows for the scanning of arbitrary surfaces with a high degree of accuracy. The asset is ideal for many semiconductor related measurements due to its increased accuracy and precision. It is also used for calibrating and cleaning machines, process monitoring, and even automated 3D analysis. In addition, MITUTOYO SJ-301 can be used as a scanning device to measure mask shapes. In order to ensure accurate measurements, the model is equipped with a multi-axis vector measurement option. This feature allows for faster measurements and real-time feedback. Additionally, the equipment has an automatic setting feature which allows it to adjust to the material and conform to differing heights and angles. Furthermore, its advanced graphical user interface makes the system simpler to use, enabling even non-experts to take precise measurements. SJ-301 is an ideal wafer testing and metrology unit for producing high-precision and high-quality measurements of large areas in a variety of industries. Its accuracy, speed, and ease of use make it an invaluable tool for many semiconductor-related applications.